Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/244809
Title: Partitioning Patches into Test-equivalence Classes for Scaling Program Repair.
Authors: Mechtaev, Sergey 
Gao, Xiang 
Tan, Shin Hwei 
Roychoudhury, Abhik 
Keywords: cs.SE
cs.SE
Issue Date: 2017
Citation: Mechtaev, Sergey, Gao, Xiang, Tan, Shin Hwei, Roychoudhury, Abhik (2017). Partitioning Patches into Test-equivalence Classes for Scaling Program Repair.. CoRR abs/1707.03139. ScholarBank@NUS Repository.
Abstract: Automated program repair is a problem of finding a transformation (called a patch) of a given incorrect program that eliminates the observable failures. It has important applications such as providing debugging aids, automatically grading assignments and patching security vulnerabilities. A common challenge faced by all existing repair techniques is scalability to large patch spaces, since there are many candidate patches that these techniques explicitly or implicitly consider. The correctness criterion for program repair is often given as a suite of tests, since a formal specification of the intended program behavior may not be available. Current repair techniques do not scale due to the large number of test executions performed by the underlying search algorithms. We address this problem by introducing a methodology of patch generation based on a test-equivalence relation (if two programs are "test-equivalent" for a given test, they produce indistinguishable results on this test). We propose two test-equivalence relations based on runtime values and dependencies respectively and present an algorithm that performs on-the-fly partitioning of patches into test-equivalence classes. Our experiments on real-world programs reveal that the proposed methodology drastically reduces the number of test executions and therefore provides an order of magnitude efficiency improvement over existing repair techniques, without sacrificing patch quality.
Source Title: CoRR
URI: https://scholarbank.nus.edu.sg/handle/10635/244809
ISSN: 2331-8422
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