Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/244809
DC FieldValue
dc.titlePartitioning Patches into Test-equivalence Classes for Scaling Program Repair.
dc.contributor.authorMechtaev, Sergey
dc.contributor.authorGao, Xiang
dc.contributor.authorTan, Shin Hwei
dc.contributor.authorRoychoudhury, Abhik
dc.date.accessioned2023-09-04T01:51:02Z
dc.date.available2023-09-04T01:51:02Z
dc.date.issued2017
dc.identifier.citationMechtaev, Sergey, Gao, Xiang, Tan, Shin Hwei, Roychoudhury, Abhik (2017). Partitioning Patches into Test-equivalence Classes for Scaling Program Repair.. CoRR abs/1707.03139. ScholarBank@NUS Repository.
dc.identifier.issn2331-8422
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/244809
dc.description.abstractAutomated program repair is a problem of finding a transformation (called a patch) of a given incorrect program that eliminates the observable failures. It has important applications such as providing debugging aids, automatically grading assignments and patching security vulnerabilities. A common challenge faced by all existing repair techniques is scalability to large patch spaces, since there are many candidate patches that these techniques explicitly or implicitly consider. The correctness criterion for program repair is often given as a suite of tests, since a formal specification of the intended program behavior may not be available. Current repair techniques do not scale due to the large number of test executions performed by the underlying search algorithms. We address this problem by introducing a methodology of patch generation based on a test-equivalence relation (if two programs are "test-equivalent" for a given test, they produce indistinguishable results on this test). We propose two test-equivalence relations based on runtime values and dependencies respectively and present an algorithm that performs on-the-fly partitioning of patches into test-equivalence classes. Our experiments on real-world programs reveal that the proposed methodology drastically reduces the number of test executions and therefore provides an order of magnitude efficiency improvement over existing repair techniques, without sacrificing patch quality.
dc.sourceElements
dc.subjectcs.SE
dc.subjectcs.SE
dc.typeArticle
dc.date.updated2023-09-03T10:37:23Z
dc.contributor.departmentDEPARTMENT OF COMPUTER SCIENCE
dc.description.sourcetitleCoRR
dc.description.volumeabs/1707.03139
dc.published.stateUnpublished
Appears in Collections:Staff Publications
Elements

Show simple item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
1707.03139v2.pdf778.24 kBAdobe PDF

OPEN

Pre-printView/Download

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.