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Title: Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems
Authors: Nguyen, Duy-Thanh
Ho, Nhut-Minh 
Wong, Weng-Fai 
Chang, Ik-Joon
Keywords: Availability
DRAM chips
Error correction codes
Failure analysis
Fault diagnosis
Memory architecture
Memory management
On-die ECC
Semiconductor device reliability
Semiconductor device testing
Issue Date: 10-Dec-2021
Publisher: MDPI
Citation: Nguyen, Duy-Thanh, Ho, Nhut-Minh, Wong, Weng-Fai, Chang, Ik-Joon (2021-12-10). Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems. Sensors 21 (24) : 8271. ScholarBank@NUS Repository.
Rights: Attribution 4.0 International
Abstract: With technology scaling, maintaining the reliability of dynamic random-access memory (DRAM) has become more challenging. Therefore, on-die error correction codes have been introduced to accommodate reliability issues in DDR5. However, the current solution still suffers from high overhead when a large DRAM capacity is used to deliver high performance. We present a DRAM chip architecture that can track faults at byte-level DRAM cell errors to address this problem. DRAM faults are classified as temporary or permanent in our proposed architecture, with no additional pins and with minor DRAM chip modifications. Hence, we achieve reliability comparable to that of other state-of-the-art solutions while incurring negligible performance and energy overhead. Furthermore, the faulty locations are efficiently exposed to the operating system (OS). Thus, we can significantly reduce the required scrubbing cycle by scrubbing only faulty DRAM pages while reducing the system failure probability up to 5000?7000 times relative to conventional operation. © 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https:// 4.0/).
Source Title: Sensors
ISSN: 1424-8220
DOI: 10.3390/s21248271
Rights: Attribution 4.0 International
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