Please use this identifier to cite or link to this item: https://doi.org/10.1088/2053-1583/abf54c
Title: Fast growth of centimeter-scale single-crystal copper foils with high-index planes by the edge-incision effect
Authors: Li, L
Ma, T 
Yu, W
Zhu, M 
Li, J
Chen, Z 
Li, H
Zhao, M 
Teng, J
Tian, B 
Su, C 
Loh, KP 
Issue Date: 1-Jul-2021
Publisher: IOP Publishing
Citation: Li, L, Ma, T, Yu, W, Zhu, M, Li, J, Chen, Z, Li, H, Zhao, M, Teng, J, Tian, B, Su, C, Loh, KP (2021-07-01). Fast growth of centimeter-scale single-crystal copper foils with high-index planes by the edge-incision effect. 2D Materials 8 (3) : 035019-035019. ScholarBank@NUS Repository. https://doi.org/10.1088/2053-1583/abf54c
Abstract: Single-crystal copper substrates have gained importance for the preparation of high-quality graphene and hexagonal boron nitride monolayer films by chemical vapor deposition (CVD). Especially, large-scale single-crystal copper foils with high-index planes are synthesized recently and attract great interests. However, the current synthesis methods of single-crystal copper foils and films are energy and time-consuming. Here, we show a rapid and efficient approach for the preparation of centimeter-scale single-crystal copper foils by making small incisions at the edges of polycrystalline copper foils before high-temperature annealing. 1.5 cm × 4 cm pieces of grain-boundary-free copper foils can be prepared by annealing at 1080 °C for 60 min. The annealed copper foil manifests a single high-index plane and is grain-boundary-free over the whole area. We also show that CVD of graphene on the high-index single-crystal copper affords a higher growth rate than on low-index copper substrates.
Source Title: 2D Materials
URI: https://scholarbank.nus.edu.sg/handle/10635/219423
ISSN: 2053-1583
DOI: 10.1088/2053-1583/abf54c
Appears in Collections:Staff Publications
Elements

Show full item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
FASTGR~1.PDFAccepted version3.61 MBAdobe PDF

OPEN

NoneView/Download

Page view(s)

80
checked on Jan 26, 2023

Download(s)

1
checked on Jan 26, 2023

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.