Please use this identifier to cite or link to this item: https://doi.org/10.1002/advs.201900291
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dc.titleEfficient Surface Plasmon Polariton Excitation and Control over Outcoupling Mechanisms in Metal–Insulator–Metal Tunneling Junctions
dc.contributor.authorKsenia S. Makarenko
dc.contributor.authorThanh Xuan Hoang
dc.contributor.authorThorin J. Duffin
dc.contributor.authorAndreea Radulescu
dc.contributor.authorVIJITH KALATHINGAL
dc.contributor.authorHenri J. Lezec
dc.contributor.authorHong‐Son Chu
dc.contributor.authorNIJHUIS,CHRISTIAN ALBERTUS
dc.date.accessioned2021-05-14T08:33:33Z
dc.date.available2021-05-14T08:33:33Z
dc.date.issued2020-02-22
dc.identifier.citationKsenia S. Makarenko, Thanh Xuan Hoang, Thorin J. Duffin, Andreea Radulescu, VIJITH KALATHINGAL, Henri J. Lezec, Hong‐Son Chu, NIJHUIS,CHRISTIAN ALBERTUS (2020-02-22). Efficient Surface Plasmon Polariton Excitation and Control over Outcoupling Mechanisms in Metal–Insulator–Metal Tunneling Junctions. Advanced Science 7 (8) : 1900291. ScholarBank@NUS Repository. https://doi.org/10.1002/advs.201900291
dc.identifier.issn21983844
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/191231
dc.description.abstractSurface plasmon polaritons (SPPs) are viable candidates for integration into on-chip nano-circuitry that allow access to high data bandwidths and low energy consumption. Metal-insulator-metal tunneling junctions (MIM-TJs) have recently been shown to excite and detect SPPs electrically; however, experimentally measured efficiencies and outcoupling mechanisms are not fully understood. It is shown that the MIM-TJ cavity SPP mode (MIM-SPP) can outcouple via three pathways to i) photons via scattering of MIM-SPP at the MIM-TJ interfaces, ii) SPPs at the metal-dielectric interfaces (bound-SPPs) by mode coupling through the electrodes, and iii) photons and bound-SPP modes by mode coupling at the MIM-TJ edges. It is also shown that, for Al-AlOx-Cr-Au MIM-TJs on glass, the MIM-SPP mode outcouples efficiently to bound-SPPs through either electrode (pathway 2); this outcoupling pathway can be selectively turned on and off by changing the respective electrode thickness. Outcoupling at the MIM-TJ edges (pathway 3) is efficient and sensitive to the edge topography, whereas most light emission originates from roughness-induced scattering of the MIM-SPP mode (pathway 1). Using an arbitrary roughness profile, it is demonstrated that various roughness facets can raise MIM-SPP outcoupling efficiencies to 0.62%. These results pave the way for understanding the topographical parameters needed to develop CMOS-compatible plasmonic circuitry elements.
dc.description.urihttps://doi.org/10.1002/advs.201900291
dc.publisherJohn Wiley and Sons Inc.
dc.subjectinelastic electron tunneling
dc.subjectlight emission
dc.subjectroughness
dc.subjectsurface plasmon polaritons
dc.subjecttunnel junctions
dc.typeArticle
dc.contributor.departmentBIOMEDICAL ENGINEERING
dc.contributor.departmentCENTRE FOR ADVANCED 2D MATERIALS
dc.contributor.departmentDEPT OF CHEMISTRY
dc.contributor.departmentNUS GRAD SCH FOR INTEGRATIVE SCI & ENGG
dc.contributor.departmentNUS NANOSCIENCE & NANOTECH INITIATIVE
dc.description.doi10.1002/advs.201900291
dc.description.sourcetitleAdvanced Science
dc.description.volume7
dc.description.issue8
dc.description.page1900291
dc.published.statePublished
dc.grant.idNRF-CRP17-2017-08
dc.grant.fundingagencyNational Research Foundation (NRF)
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