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https://doi.org/10.1109/LSSC.2020.3025191
Title: | Fully-Synthesizable All-Digital Unified Dynamic Entropy Generation, Extraction and Utilization within the Same Cryptographic Core | Authors: | SACHIN TANEJA ALIOTO,MASSIMO BRUNO |
Keywords: | Hardware security TRNGs dynamic entropy private key cryptography pulsed latch constrained secure systems |
Issue Date: | 18-Sep-2020 | Publisher: | Institute of Electrical and Electronics Engineers Inc. | Citation: | SACHIN TANEJA, ALIOTO,MASSIMO BRUNO (2020-09-18). Fully-Synthesizable All-Digital Unified Dynamic Entropy Generation, Extraction and Utilization within the Same Cryptographic Core. IEEE Solid-State Circuits Letters 3 : 402 - 405. ScholarBank@NUS Repository. https://doi.org/10.1109/LSSC.2020.3025191 | Rights: | CC0 1.0 Universal | Abstract: | This work introduces a novel class of fully-synthesizable all-digital True Random Number Generators (TRNGs) using the same private-key cryptographic core for raw dynamic entropy generation, its extraction via post-processing, and its utilization as crypto-key for constrained secure systems. Endogenous random bit generation is achieved via clock pulsewidth overstretching in the digital implementation of private-key cryptographic algorithms using pulsed-latch pipelines, leveraging inherent Shannon confusion and diffusion. Demonstration on a 40-nm testchip based on a SIMON cryptographic core shows 64-bit key encryption down to 0.25 pJ/bit at 0.45 V, random number generation with cryptographic-grade entropy at 2.5 pJ/bit across manufacturing lots, dice, voltages and temperature corners. The overall area is kept well below the 106 F2 area wall (F = minimum feature size). | Source Title: | IEEE Solid-State Circuits Letters | URI: | https://scholarbank.nus.edu.sg/handle/10635/191223 | ISSN: | 25739603 | DOI: | 10.1109/LSSC.2020.3025191 | Rights: | CC0 1.0 Universal |
Appears in Collections: | Staff Publications Elements |
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Fully-Synthesizable All-Digital Unified Dynamic Entropy Generation Extraction.pdf | 1.12 MB | Adobe PDF | OPEN | Post-print | View/Download |
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