Please use this identifier to cite or link to this item: https://doi.org/10.1039/c7nr06642b
Title: Intrinsic hydrophilic nature of epitaxial thin-film of rare-earth oxide grown by pulsed laser deposition
Authors: Saurav Prakash 
Siddhartha Ghosh 
Abhijeet Patra 
Meenakshi Annamalai 
Mallikarjuna Rao Motapothula 
Soumya Sarkar 
Sherman J. R. Tan
Jia Zhunan 
Kian Ping Loh 
T. Venkatesan 
Keywords: water contact angle
pulsed laser deposition
atomic force microscopy
rare-earth oxide
Issue Date: 17-Jan-2018
Citation: Saurav Prakash, Siddhartha Ghosh, Abhijeet Patra, Meenakshi Annamalai, Mallikarjuna Rao Motapothula, Soumya Sarkar, Sherman J. R. Tan, Jia Zhunan, Kian Ping Loh, T. Venkatesan (2018-01-17). Intrinsic hydrophilic nature of epitaxial thin-film of rare-earth oxide grown by pulsed laser deposition. Nanoscale 10 : 3356 - 3361. ScholarBank@NUS Repository. https://doi.org/10.1039/c7nr06642b
Abstract: Herein, we report a systematic study of water contact angle (WCA) of rare-earth oxide thin-films. These ultra-smooth and epitaxial thin-films were grown using pulsed laser deposition and then characterized using X-Ray diffraction (XRD), Rutherford backscattering spectroscopy (RBS), and atomic force microscopy (AFM). Through both the traditional sessile drop and the novel f–d method, we found that the films were intrinsically hydrophilic (WCA < 10°) just after being removed from the growth chamber, but their WCAs evolved with an exposure to the atmosphere with time to reach their eventual saturation values near 90° (but always stay ‘technically’ hydrophilic). X-Ray photoelectron spectroscopy analysis was used to further investigate qualitatively the nature of hydrocarbon contamination on the freshly prepared as well as the environmentally exposed REO thin-film samples as a function of the exposure time after they were removed from the deposition chamber. A clear correlation between the carbon coverage of the surface and the increase in WCA was observed for all of the rare-earth films, indicating the extrinsic nature of the surface wetting properties of these films and having no relation to the electronic configuration of the rare-earth atoms as proposed by Azimi et al.
Source Title: Nanoscale
URI: https://scholarbank.nus.edu.sg/handle/10635/189263
ISSN: 20403372
DOI: 10.1039/c7nr06642b
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