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https://doi.org/10.1063/1.5128657
Title: | Considerations for the nano aperture ion source: Geometrical design and electrical control | Authors: | Jeroen A. van Kan Rudy Pang Tanmoy Basu Yanxin Dou Gokul Nicolas Tarino Jack Tregidga Sangita Chaki Roy Huei Ming Tan |
Keywords: | Lenses Focused ion beam Chemical vapor deposition Electronic control systems Physics of gases Tensile stress Microcontroller Ion sources Optical aberrations Electron beams |
Issue Date: | 10-Jan-2020 | Publisher: | AIP Publishing | Citation: | Jeroen A. van Kan, Rudy Pang, Tanmoy Basu, Yanxin Dou, Gokul, Nicolas Tarino, Jack Tregidga, Sangita Chaki Roy, Huei Ming Tan (2020-01-10). Considerations for the nano aperture ion source: Geometrical design and electrical control. Review of Scientific Instruments 91 (1). ScholarBank@NUS Repository. https://doi.org/10.1063/1.5128657 | Abstract: | A new type of ion source is being developed for proton beam writing and other focused ion beam applications. The potential of this source as well as achieved performance of the nano aperture ion source will be evaluated. Based on the ideal source parameters, critical geometrical parameters constraining chromatic aberrations and a possible pathway to achieve this performance will be presented. Finally, an electronic control system to minimize chromatic and spherical aberrations to an acceptable level will be demonstrated. | Source Title: | Review of Scientific Instruments | URI: | https://scholarbank.nus.edu.sg/handle/10635/188023 | ISSN: | 10897623 | DOI: | 10.1063/1.5128657 |
Appears in Collections: | Staff Publications Elements |
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Considerations for the nano aperture ion source Geometrical design and electrical control.pdf | 1.66 MB | Adobe PDF | OPEN | Published | View/Download |
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