Please use this identifier to cite or link to this item: https://doi.org/10.1186/1556-276X-9-192
Title: Tunable antireflection from conformal Al-doped ZnO films on nanofaceted Si templates
Authors: Basu, T 
Kumar, M
Sahoo, P.K
Kanjilal, A
Som, T
Keywords: Aluminum coatings
Infrared devices
Ion beams
Optical films
Refractive index
Semiconductor doping
Silicon
Sputter deposition
Zinc oxide
Al-doped zno films
Aluminum-doped zinc oxide
Anti-reflection
Depth dependents
NanoPatterning
Near-infrared range
Photovoltaic devices
Surface reflectance
Aluminum
Issue Date: 2014
Citation: Basu, T, Kumar, M, Sahoo, P.K, Kanjilal, A, Som, T (2014). Tunable antireflection from conformal Al-doped ZnO films on nanofaceted Si templates. Nanoscale Research Letters 9 (1) : 1-7. ScholarBank@NUS Repository. https://doi.org/10.1186/1556-276X-9-192
Rights: Attribution 4.0 International
Abstract: Photon harvesting by reducing reflection loss is the basis of photovoltaic devices. Here, we show the efficacy of Al-doped ZnO (AZO) overlayer on ion beam-synthesized nanofaceted silicon for suppressing reflection loss. In particular, we demonstrate thickness-dependent tunable antireflection (AR) from conformally grown AZO layer, showing a systematic shift in the reflection minima from ultraviolet to visible to near-infrared ranges with increasing thickness. Tunable AR property is understood in light of depth-dependent refractive index of nanofaceted silicon and AZO overlayer. This improved AR property significantly increases the fill factor of such textured heterostructures, which reaches its maximum for 60-nm AZO compared to the ones based on planar silicon. This thickness matches with the one that shows the maximum reduction in surface reflectance. PACS: 81.07.-b; 42.79.Wc; 81.16.Rf; 81.15.Cd © 2014, Basu et al.; licensee Springer.
Source Title: Nanoscale Research Letters
URI: https://scholarbank.nus.edu.sg/handle/10635/183643
ISSN: 19317573
DOI: 10.1186/1556-276X-9-192
Rights: Attribution 4.0 International
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