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https://scholarbank.nus.edu.sg/handle/10635/177858
| Title: | CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS | Authors: | ANG DIING SHENP | Issue Date: | 1997 | Citation: | ANG DIING SHENP (1997). CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS. ScholarBank@NUS Repository. | URI: | https://scholarbank.nus.edu.sg/handle/10635/177858 |
| Appears in Collections: | Ph.D Theses (Restricted) |
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| b20609577.pdf | 16.98 MB | Adobe PDF | RESTRICTED | None | Log In |
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