Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/177858
| DC Field | Value | |
|---|---|---|
| dc.title | CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS | |
| dc.contributor.author | ANG DIING SHENP | |
| dc.date.accessioned | 2020-10-20T03:49:42Z | |
| dc.date.available | 2020-10-20T03:49:42Z | |
| dc.date.issued | 1997 | |
| dc.identifier.citation | ANG DIING SHENP (1997). CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN SUBMICROMETER MOS TRANSISTORS. ScholarBank@NUS Repository. | |
| dc.identifier.uri | https://scholarbank.nus.edu.sg/handle/10635/177858 | |
| dc.source | CCK BATCHLOAD 20201023 | |
| dc.type | Thesis | |
| dc.contributor.department | ELECTRICAL ENGINEERING | |
| dc.contributor.supervisor | C.H. LING | |
| dc.description.degree | Ph.D | |
| dc.description.degreeconferred | DOCTOR OF PHILOSOPHY | |
| Appears in Collections: | Ph.D Theses (Restricted) | |
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| File | Description | Size | Format | Access Settings | Version | |
|---|---|---|---|---|---|---|
| b20609577.pdf | 16.98 MB | Adobe PDF | RESTRICTED | None | Log In |
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