Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/172123
Title: NUMERICAL AND EXPERIMENTAL STUDIES OF BACKGATING IN HIGH ELECTRON MOBILITY TRANSISTORS
Authors: LEE KIN MAN
Issue Date: 1995
Citation: LEE KIN MAN (1995). NUMERICAL AND EXPERIMENTAL STUDIES OF BACKGATING IN HIGH ELECTRON MOBILITY TRANSISTORS. ScholarBank@NUS Repository.
URI: https://scholarbank.nus.edu.sg/handle/10635/172123
Appears in Collections:Master's Theses (Restricted)

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