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https://doi.org/10.1109/EEEIC.2018.8493798
Title: | Voltage Stability Assessment by Holomorphically Estimating the Bifurcation Point of Electric Grids | Authors: | Moirangthem, Joymala Krishnanand, KR Panda, SK Amaratunga, Gehan |
Keywords: | Science & Technology Technology Engineering, Electrical & Electronic Engineering AC power flow holomorphic embedding fast power flow voltage stability bifurcation point smart grids modal analysis POWER-FLOW |
Issue Date: | 2018 | Publisher: | IEEE | Citation: | Moirangthem, Joymala, Krishnanand, KR, Panda, SK, Amaratunga, Gehan (2018). Voltage Stability Assessment by Holomorphically Estimating the Bifurcation Point of Electric Grids. IEEE International Conference on Environment and Electrical Engineering (EEEIC) / IEEE Industrial and Commercial Power Systems Europe (I&CPS Europe). ScholarBank@NUS Repository. https://doi.org/10.1109/EEEIC.2018.8493798 | Abstract: | © 2018 IEEE. Modernization of the grid, inclusive of high renewable energy penetration and the consequent power variability, requires fast power-flow computations for useful management of power in new network configurations. Voltage stability of an electrical grid is a big challenge to solve in power system operation, so as to avoid voltage collapse and subsequent black outs. This paper presents a novel means of voltage stability assessment by estimating the bifurcation point within the context of a non-iterative power-flow method known as Holomorphic Embedded Power Flow (HEPF). HEPF is computationally fast and guarantees solution to the power flow problem through constructing the mathematical solution for the power-flow problem, provided the solution exists. A 3-bus system is first used to explain the holomorphic matrix formulations and then demonstrated on a 4-bus system and a 9-bus test-case to evaluate proximity to a critical point with respect to load change. | Source Title: | IEEE International Conference on Environment and Electrical Engineering (EEEIC) / IEEE Industrial and Commercial Power Systems Europe (I&CPS Europe) | URI: | https://scholarbank.nus.edu.sg/handle/10635/171094 | ISBN: | 9781538651858 | DOI: | 10.1109/EEEIC.2018.8493798 |
Appears in Collections: | Staff Publications Elements |
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