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Title: Characteristic Lengths of Interlayer Charge Transfer in Correlated Oxide Heterostructures
Authors: Omar, Ganesh Ji
Li, Mengsha
Chi, Xiao 
Huang, Zhen 
Lim, Zhi Shiuh 
Prakash, Saurav 
Zeng, Shengwei 
Li, Changjian 
Yu, Xiaojiang 
Tang, Chunhua 
Song, Dongsheng 
Rusydi, Andrivo 
Venkatesan, Thirumalai 
Pennycook, Stephen John 
Ariando, Ariando 
Keywords: Buffer layer
Charge transfer
Interface engineering
Perovskite oxide heterostructures
Issue Date: 5-Mar-2020
Publisher: American Chemical Society
Citation: Omar, Ganesh Ji, Li, Mengsha, Chi, Xiao, Huang, Zhen, Lim, Zhi Shiuh, Prakash, Saurav, Zeng, Shengwei, Li, Changjian, Yu, Xiaojiang, Tang, Chunhua, Song, Dongsheng, Rusydi, Andrivo, Venkatesan, Thirumalai, Pennycook, Stephen John, Ariando, Ariando (2020-03-05). Characteristic Lengths of Interlayer Charge Transfer in Correlated Oxide Heterostructures. NANO LETTERS 20 (4) : 2493 - 2499. ScholarBank@NUS Repository.
Abstract: Using interlayer interaction to control functional heterostructures with atomic-scale designs has become one of the most effective interface-engineering strategies nowadays. Here, we demonstrate the effect of a crystalline LaFeO3 buffer layer on amorphous and crystalline LaAlO3/SrTiO3 heterostructures. The LaFeO3 buffer layer acts as an energetically favored electron acceptor in both LaAlO3/SrTiO3 systems, resulting in modulation of interfacial carrier density and hence metal-to-insulator transition. For amorphous and crystalline LaAlO3/SrTiO3 heterostructures, the metal-to-insulator transition is found when the LaFeO3 layer thickness crosses 3 and 6 unit cells, respectively. Such different critical LaFeO3 thicknesses are explained in terms of distinct characteristic lengths of the redox-reaction-mediated and polar-catastrophe-dominated charge transfer, controlled by the interfacial atomic contact and Thomas-Fermi screening effect, respectively. Our results not only shed light on the complex interlayer charge transfer across oxide heterostructures but also provide a new route to precisely tailor the charge-transfer process at a functional interface. © 2020 American Chemical Society.
Source Title: NANO LETTERS
ISSN: 15306984
DOI: 10.1021/acs.nanolett.9b05231
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