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https://scholarbank.nus.edu.sg/handle/10635/153909
| Title: | 0.5um EEPROM CHARACTERIZATION | Authors: | SEOW KIAN CHIEW | Keywords: | Electrically Erasable Programmable Read Only Memory EEPROM Test structure |
Issue Date: | 2007 | Citation: | SEOW KIAN CHIEW (2007). 0.5um EEPROM CHARACTERIZATION. ScholarBank@NUS Repository. | Abstract: | This dissertation describes the characterization of various test structures used in the 0.5um Electrically Erasable Programmable Read Only Memory (EEPROM) 0.5um devices. | URI: | https://scholarbank.nus.edu.sg/handle/10635/153909 |
| Appears in Collections: | Master's Theses (Restricted) |
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| File | Description | Size | Format | Access Settings | Version | |
|---|---|---|---|---|---|---|
| Seow Kian Chiew_Final Report.pdf | 845.9 kB | Adobe PDF | RESTRICTED | None | Log In |
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