Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/153909
Title: 0.5um EEPROM CHARACTERIZATION
Authors: SEOW KIAN CHIEW
Keywords: Electrically Erasable Programmable Read Only Memory
EEPROM
Test structure
Issue Date: 2007
Citation: SEOW KIAN CHIEW (2007). 0.5um EEPROM CHARACTERIZATION. ScholarBank@NUS Repository.
Abstract: This dissertation describes the characterization of various test structures used in the 0.5um Electrically Erasable Programmable Read Only Memory (EEPROM) 0.5um devices.
URI: https://scholarbank.nus.edu.sg/handle/10635/153909
Appears in Collections:Master's Theses (Restricted)

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