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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/153909
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dc.title0.5um EEPROM CHARACTERIZATION
dc.contributor.authorSEOW KIAN CHIEW
dc.date.accessioned2019-05-09T08:15:33Z
dc.date.available2019-05-09T08:15:33Z
dc.date.issued2007
dc.identifier.citationSEOW KIAN CHIEW (2007). 0.5um EEPROM CHARACTERIZATION. ScholarBank@NUS Repository.
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/153909
dc.description.abstractThis dissertation describes the characterization of various test structures used in the 0.5um Electrically Erasable Programmable Read Only Memory (EEPROM) 0.5um devices.
dc.sourceSMA BATCHLOAD 20190422
dc.subjectElectrically Erasable Programmable Read Only Memory
dc.subjectEEPROM
dc.subjectTest structure
dc.typeThesis
dc.contributor.departmentSINGAPORE-MIT ALLIANCE
dc.contributor.supervisorChoi Wee Kiong
dc.contributor.supervisorChan Hiau Tong
dc.contributor.supervisorDicky Chua
dc.description.degreeMaster's
dc.description.degreeconferredMASTER OF SCIENCE IN ADVANCED MATERIALS FOR MICRO- & NANO- SYSTEMS
dc.description.other1. Professor Choi Wee Kiong. 2. Mr. Chan Hiau Tong, Chartered. 3. Mr. Dicky Chua, Chartered
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