Please use this identifier to cite or link to this item:
|Title:||Spatially resolved electrical parameters of silicon wafers and solar cells by contactless photoluminescence imaging||Authors:||Hameiri, Z.
|Issue Date:||18-Feb-2013||Citation:||Hameiri, Z., Chaturvedi, P. (2013-02-18). Spatially resolved electrical parameters of silicon wafers and solar cells by contactless photoluminescence imaging. Applied Physics Letters 102 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4792348||Abstract:||A contactless method to extract spatially resolved electrical parameters of silicon wafers and silicon solar cells is introduced. The method is based on photoluminescence imaging and can be applied throughout the solar cell fabrication process, even before junction formation. To validate the method, the parameters obtained by it are compared to the ones obtained by the well-established Suns-Voc measurement. Good agreement is obtained. © 2013 American Institute of Physics.||Source Title:||Applied Physics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/117161||ISSN:||00036951||DOI:||10.1063/1.4792348|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.