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Title: Quantitative investigation of phase retrieval from x-ray phase-contrast tomographic images
Authors: Moser, H.O. 
Banas, K. 
Chen, A. 
Vo Nghia, T.
Jian, L.K. 
Kalaiselvi, S.M.P. 
Liu, G. 
Maniam, S.M. 
Gu, P.D. 
Wilkins, S.W.
Gureyev, T.E.
Mayo, S.C.
Cholewa, M.
Li, Z.J.
Keywords: Micro manufacturing
Phase contrast imaging
Phase retrieval
Synchrotron radiation
Issue Date: 2008
Citation: Moser, H.O., Banas, K., Chen, A., Vo Nghia, T., Jian, L.K., Kalaiselvi, S.M.P., Liu, G., Maniam, S.M., Gu, P.D., Wilkins, S.W., Gureyev, T.E., Mayo, S.C., Cholewa, M., Li, Z.J. (2008). Quantitative investigation of phase retrieval from x-ray phase-contrast tomographic images. Proceedings of SPIE - The International Society for Optical Engineering 7078 : -. ScholarBank@NUS Repository.
Abstract: X-ray phase-contrast tomographic microimaging is a powerful tool to reveal the internal structure of opaque soft-matter objects that are not easily seen in standard absorption contrast. In such low Z materials, the phase shift of X-rays transmitted can be important as compared to the absorption. An easy experimental set up that exploits refractive contrast formation can deliver images that are providing detailed structural information. Applications are abundant in fields including polymer science and engineering, biology, biomedical engineering, life sciences, zoology, water treatment and filtration, membrane science, and micro/nanomanufacturing. However, available software for absorptive contrast tomography cannot be simply used for structure retrieval as the contrast forming effect is different. In response, CSIRO has developed a reconstruction code for phase-contrast imaging. Here, we present a quantitative comparison of a micro phantom manufactured at SSLS with the object reconstructed by the code using X-ray images taken at SSLS. The phantom is a 500 μm thick 800 μm diameter cylindrical disk of SU-8 resist having various eccentric cylindrical bores with diameters ranging from 350 μm to 40 μm. Comparison of these parameters that are well known from design and post-manufacturing measurements with reconstructed ones gives encouraging results.
Source Title: Proceedings of SPIE - The International Society for Optical Engineering
ISBN: 9780819472984
ISSN: 0277786X
DOI: 10.1117/12.794497
Appears in Collections:Staff Publications

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