Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.359353
Title: Transmission electron microscopy study of microstructure and [112̄0]//[001] polycrystalline epitaxy of CoNiCr/Cr bilayer films
Authors: Tang, L.
Lu, D. 
Thomas, G.
Issue Date: 1995
Citation: Tang, L., Lu, D., Thomas, G. (1995). Transmission electron microscopy study of microstructure and [112̄0]//[001] polycrystalline epitaxy of CoNiCr/Cr bilayer films. Journal of Applied Physics 77 (1) : 47-53. ScholarBank@NUS Repository. https://doi.org/10.1063/1.359353
Abstract: Detailed investigations of the microstructure and polycrystalline epitaxy of CoNiCr/Cr bilayer films have been carried out using various techniques of transmission electron microscopy. The average grain size for both the Cr and CoNiCr layers was about 510 Å although there is a great difference in their morphology. Analysis of the discontinuous ring (arced) diffraction patterns of the layers showed that the Cr underlayer is strongly [001] textured and the CoNiCr layer is weakly [112̄0] textured. The angular distribution of the Cr underlayer [001] texture axis was determined to be 6.7°and the ratio of the number of [001] textured grains to that of the randomly oriented grains was estimated to be 3:7 using dark-field imaging techniques. © 1995 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/115338
ISSN: 00218979
DOI: 10.1063/1.359353
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