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|Title:||Transmission electron microscopy study of microstructure and [112̄0]// polycrystalline epitaxy of CoNiCr/Cr bilayer films||Authors:||Tang, L.
|Issue Date:||1995||Citation:||Tang, L., Lu, D., Thomas, G. (1995). Transmission electron microscopy study of microstructure and [112̄0]// polycrystalline epitaxy of CoNiCr/Cr bilayer films. Journal of Applied Physics 77 (1) : 47-53. ScholarBank@NUS Repository. https://doi.org/10.1063/1.359353||Abstract:||Detailed investigations of the microstructure and polycrystalline epitaxy of CoNiCr/Cr bilayer films have been carried out using various techniques of transmission electron microscopy. The average grain size for both the Cr and CoNiCr layers was about 510 Å although there is a great difference in their morphology. Analysis of the discontinuous ring (arced) diffraction patterns of the layers showed that the Cr underlayer is strongly  textured and the CoNiCr layer is weakly [112̄0] textured. The angular distribution of the Cr underlayer  texture axis was determined to be 6.7°and the ratio of the number of  textured grains to that of the randomly oriented grains was estimated to be 3:7 using dark-field imaging techniques. © 1995 American Institute of Physics.||Source Title:||Journal of Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/115338||ISSN:||00218979||DOI:||10.1063/1.359353|
|Appears in Collections:||Staff Publications|
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