Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.359353
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dc.titleTransmission electron microscopy study of microstructure and [112̄0]//[001] polycrystalline epitaxy of CoNiCr/Cr bilayer films
dc.contributor.authorTang, L.
dc.contributor.authorLu, D.
dc.contributor.authorThomas, G.
dc.date.accessioned2014-12-12T07:14:19Z
dc.date.available2014-12-12T07:14:19Z
dc.date.issued1995
dc.identifier.citationTang, L., Lu, D., Thomas, G. (1995). Transmission electron microscopy study of microstructure and [112̄0]//[001] polycrystalline epitaxy of CoNiCr/Cr bilayer films. Journal of Applied Physics 77 (1) : 47-53. ScholarBank@NUS Repository. https://doi.org/10.1063/1.359353
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/115338
dc.description.abstractDetailed investigations of the microstructure and polycrystalline epitaxy of CoNiCr/Cr bilayer films have been carried out using various techniques of transmission electron microscopy. The average grain size for both the Cr and CoNiCr layers was about 510 Å although there is a great difference in their morphology. Analysis of the discontinuous ring (arced) diffraction patterns of the layers showed that the Cr underlayer is strongly [001] textured and the CoNiCr layer is weakly [112̄0] textured. The angular distribution of the Cr underlayer [001] texture axis was determined to be 6.7°and the ratio of the number of [001] textured grains to that of the randomly oriented grains was estimated to be 3:7 using dark-field imaging techniques. © 1995 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.359353
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentINSTITUTE OF MICROELECTRONICS
dc.description.doi10.1063/1.359353
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume77
dc.description.issue1
dc.description.page47-53
dc.identifier.isiutA1995PZ85900009
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