Please use this identifier to cite or link to this item:
https://doi.org/10.1140/epjb/e2005-00183-6
Title: | Exchange bias on epitaxial Ni films due to ultrathin NiO layer | Authors: | Lukaszew, R.A. Mitra, M. Zhang, Z. Yeadon, M. |
Issue Date: | May-2005 | Citation: | Lukaszew, R.A., Mitra, M., Zhang, Z., Yeadon, M. (2005-05). Exchange bias on epitaxial Ni films due to ultrathin NiO layer. European Physical Journal B 45 (2) : 181-184. ScholarBank@NUS Repository. https://doi.org/10.1140/epjb/e2005-00183-6 | Abstract: | Exchange anisotropy refers to the effect that an antiferromagnetic (AF) layer grown in contact with a ferromagnetic (FM) layer has on the magnetic response of the FM layer. The most notable changes in the FM hysteresis loop due to the surface exchange coupling are a coercivity enhanced over the value typically observed in films grown on a nonmagnetic substrate, and a shift in the hysteresis loop of the ferromagnet away from the zero field axis. A typical observation is that the thickness of the antiferromagnet needs to exceed a critical value before exchange bias is observed. Here we report on the exchange bias properties observed in an epitaxial Ni/NiO system where a thin NiO layer forms spontaneously and is observed after annealing epitaxial Ni films MBE grown on MgO substrates. © EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005. | Source Title: | European Physical Journal B | URI: | http://scholarbank.nus.edu.sg/handle/10635/107035 | ISSN: | 14346028 | DOI: | 10.1140/epjb/e2005-00183-6 |
Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.