Please use this identifier to cite or link to this item: https://doi.org/10.1140/epjb/e2005-00183-6
Title: Exchange bias on epitaxial Ni films due to ultrathin NiO layer
Authors: Lukaszew, R.A.
Mitra, M.
Zhang, Z.
Yeadon, M. 
Issue Date: May-2005
Citation: Lukaszew, R.A., Mitra, M., Zhang, Z., Yeadon, M. (2005-05). Exchange bias on epitaxial Ni films due to ultrathin NiO layer. European Physical Journal B 45 (2) : 181-184. ScholarBank@NUS Repository. https://doi.org/10.1140/epjb/e2005-00183-6
Abstract: Exchange anisotropy refers to the effect that an antiferromagnetic (AF) layer grown in contact with a ferromagnetic (FM) layer has on the magnetic response of the FM layer. The most notable changes in the FM hysteresis loop due to the surface exchange coupling are a coercivity enhanced over the value typically observed in films grown on a nonmagnetic substrate, and a shift in the hysteresis loop of the ferromagnet away from the zero field axis. A typical observation is that the thickness of the antiferromagnet needs to exceed a critical value before exchange bias is observed. Here we report on the exchange bias properties observed in an epitaxial Ni/NiO system where a thin NiO layer forms spontaneously and is observed after annealing epitaxial Ni films MBE grown on MgO substrates. © EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005.
Source Title: European Physical Journal B
URI: http://scholarbank.nus.edu.sg/handle/10635/107035
ISSN: 14346028
DOI: 10.1140/epjb/e2005-00183-6
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