Please use this identifier to cite or link to this item:
|Title:||Exchange bias on epitaxial Ni films due to ultrathin NiO layer|
|Citation:||Lukaszew, R.A., Mitra, M., Zhang, Z., Yeadon, M. (2005-05). Exchange bias on epitaxial Ni films due to ultrathin NiO layer. European Physical Journal B 45 (2) : 181-184. ScholarBank@NUS Repository. https://doi.org/10.1140/epjb/e2005-00183-6|
|Abstract:||Exchange anisotropy refers to the effect that an antiferromagnetic (AF) layer grown in contact with a ferromagnetic (FM) layer has on the magnetic response of the FM layer. The most notable changes in the FM hysteresis loop due to the surface exchange coupling are a coercivity enhanced over the value typically observed in films grown on a nonmagnetic substrate, and a shift in the hysteresis loop of the ferromagnet away from the zero field axis. A typical observation is that the thickness of the antiferromagnet needs to exceed a critical value before exchange bias is observed. Here we report on the exchange bias properties observed in an epitaxial Ni/NiO system where a thin NiO layer forms spontaneously and is observed after annealing epitaxial Ni films MBE grown on MgO substrates. © EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005.|
|Source Title:||European Physical Journal B|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jan 16, 2019
WEB OF SCIENCETM
checked on Jan 7, 2019
checked on Jan 11, 2019
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.