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Toward optimal mc/dc test case generation

Godboley, Sangharatna
; Jaffar, Joxan; 
Maghareh, Rasool
; 
Dutta, Arpita
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ISSTA '21: 30th ACM SIGSOFT International Symposium on Software Testing and Analysis
Publisher
ACM
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Date
2021-07-11
URI
https://scholarbank.nus.edu.sg/handle/10635/194481
DOI
10.1145/3460319.3464841
Type
Conference Paper
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