Ling Chung Ho

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Full Name

Ling Chung Ho

(not current staff)

Variants

Ling, C.-H.
Ling, C.
Ling, C.H.
Ling, Chung Ho
Ling, Chung-Ho

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

eleling@nus.edu.sg

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Type: Others

Author: Ling, C.H.

Results 1-3 of 3 (Search time: 0.004 seconds).

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	Issue Date	Title	Author(s)
1	Sep-2003	A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET	Ang, D.S.; Ling, C.H.
2	Jul-2003	High-energy tail electrons as the mechanism for the worst-case hot-carrier stress degradation of the deep submicrometer N-MOSFET	Ang, D.S.; Phua, T.W.H.; Liao, H.; Ling, C.H.
3	Jun-2004	Nonlocal hot-electron injection as the mechanism for the predominant source-side gate oxide degradation in CHE-stressed deep submicrometer n-MOSFETs	Ang, D.S.; Liao, H.; Ling, C.H.