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Quan, Chenggen

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Full Name
Quan, Chenggen
Variants
Chenggen, Q.
Quan, C.G.
Quan, C.
QUAN, CHENGGEN
 
Main Affiliation
 
Faculty
 

Publications

Results 41-60 of 215 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
41Jul-2003Deformation measurement of MEMS components using optical interferometryWang, S.H. ; Quan, C. ; Tay, C.J. ; Reading, I.; Fang, Z.P.
4215-Dec-2007Demodulation of a single interferogram based on continuous wavelet transform and phase derivativeTay, C.J. ; Quan, C. ; Sun, W. ; He, X.Y.
43Oct-2001Design of an optical probe for testing surface roughness and micro-displacementWang, S.H. ; Jin, C.J.; Tay, C.J. ; Quan, C. ; Shang, H.M. 
44Aug-2001Determination of a micromirror angular rotation using laser interferometric methodTay, C.J. ; Quan, C. ; Wang, S.H. ; Shang, H.M. 
452009Determination of curvature and twist of deformed object by digital holographic interferometryQuan, C. ; Chen, W. ; Tay, C.J. 
46Aug-2001Determination of deflection and Young's modulus of a micro-beam by means of interferometryWang, S.H. ; Tay, C.J. ; Quan, C. ; Shang, H.M. 
471-Mar-2009Determination of displacement derivative in digital holographic interferometryQuan, C. ; Tay, C.J. ; Chen, W. 
4815-Jan-2004Determination of surface contour by temporal analysis of shadow moiré fringesQuan, C. ; Fu, Y. ; Tay, C.J. 
491-Feb-2008Determination of three-dimensional displacement using two-dimensional digital image correlationQuan, C. ; Tay, C.J. ; Sun, W. ; He, X.
502013Development of a fast and accurate color-encoded digital fringe projection profilometryLiu, Z.; Quan, C. ; Tay, C.J. 
511-Mar-2003Development of a laser-scattering-based probe for on-line measurement of surface roughnessWang, S. ; Tian, Y.; Tay, C.J. ; Quan, C. 
522010Development of a sensor for layered micro-component measurement using white light interferometryTay, C.J. ; Quan, C. ; Li, M.
532005Development of an optical interferometer for micro-components inspectionWang, S.H. ; Quan, C. ; Tay, C.J. ; Reading, I.; Fang, Z.P.
541-Jul-2005Digital image correlation for whole field out-of-plane displacement measurement using a single cameraTay, C.J. ; Quan, C. ; Huang, Y.H.; Fu, Y. 
552003Dipole options for 90nm lithography technologies and belowChua, G.S.; Tay, C.J. ; Quan, C. ; Lin, Q.; Chua, L.H.
562010Direct measurement of curvature and twist using two-channel double-aperture digital shearographyBhaduri, B. ; Tay, C.J. ; Quan, C. 
572001Discerning holographic and shearographic carrier fringes using the hyperboloids in holodiagramsShang, H.M. ; Quan, C. ; Tay, C.J. ; Hung, Y.Y. 
582008Dynamic characterization of a microgyroscope by digital image spectrum correlationSun, W. ; Quan, C. ; He, X.
591-Dec-2007Dynamic characterization of MEMS structures by ultrasonic wave excitationKang, X. ; Tay, C.J. ; Quan, C. ; He, X.Y.
60Mar-2009Dynamic measurement by digital holographic interferometry based on complex phasor methodTay, C.J. ; Quan, C. ; Chen, W.