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Lau Wai Shing
rp07696
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Full Name
Lau Wai Shing
Variants
Lau, W.S.
Lau, Wai Shing
Main Affiliation
ELECTRICAL AND COMPUTER ENGINEERING
Faculty
FAC OF ENGINEERING
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Author
1
Chu, P.K.
1
Lau, W.S.
1
Qian, P.W.
1
Sandler, N.P.
Department
1
ELECTRICAL AND COMPUTER ENGINEERING
1
ELECTRICAL ENGINEERING
Subject
1
Defect states
1
Leakage current
1
Nitrous oxide (N2O)
1
Oxygen
1
Rapid thermal annealing (RTA)
.
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Type
1
Review
Date Issued
1
1996
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Author:
Khaw, K.K.
Subject:
Chemical vapor deposition (CVD)
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Issue Date
Title
Author(s)
1
May-1996
A comparison of defect states in tantalum pentoxide (Ta2O5) films after rapid thermal annealing in O2 or N2O by zero-bias thermally stimulated current spectroscopy
Lau, W.S.
;
Khaw, K.K.
;
Qian, P.W.
;
Sandler, N.P.
;
Chu, P.K.
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