Full Name
Valerio Scarani
Variants
Scarani, V.
Scarani V.
 
Main Affiliation
 
Faculty
 
Email
physv@nus.edu.sg
 
 

Publications

Results 61-79 of 79 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
617-Sep-2010Security proof for quantum key distribution using qudit systemsSheridan, L. ; Scarani, V. 
6213-Nov-2008Simulation of partial entanglement with nonsignaling resourcesBrunner, N.; Gisin, N.; Popescu, S.; Scarani, V. 
632016Solving the scattering of N photons on a two-level atom without computationRoulet, A ; Scarani, V 
647-Aug-2012State-dependent atomic excitation by multiphoton pulses propagating along two spatial modesWang, Y.; Minář, J. ; Scarani, V. 
652014Strong Constraints on Models that Explain the Violation of Bell Inequalities with Hidden Superluminal InfluencesScarani, V. ; Bancal, J.-D.; Suarez, A.; Gisin, N.
66Sep-2008Testing quantum correlations versus single-particle properties within Leggett's model and beyondBranciard, C.; Brunner, N.; Gisin, N.; Kurtsiefer, C. ; Lamas-Linares, A. ; Ling, A. ; Scarani, V. 
6730-May-2008Testing the dimension of hilbert spacesBrunner, N.; Pironio, S.; Acin, A.; Gisin, N.; Méthot, A.A.; Scarani, V. 
682013The device-independent outlook on quantum physicsScarani, V. 
692013The effects of free will on randomness expansionKoh, D.E.; Hall, M.J.W.; Setiawan; Pope, J.E.; Ekert, A. ; Kay, A. ; Scarani, V. 
7019-Nov-2010The non-locality of n noisy Popescu-Rohrlich boxesFitzi, M.; Hänggi, E.; Scarani, V. ; Wolf, S.
712009The security of practical quantum key distributionScarani, V. ; Bechmann-Pasquinucci, H.; Cerf, N.J.; Dušek, M.; Lütkenhaus, N.; Peev, M.
727-Nov-2011Time-bin entanglement of quasiparticles in semiconductor devicesChirolli, L.; Giovannetti, V.; Fazio, R.; Scarani, V. 
73Apr-2012Tomographic quantum cryptography protocols are reference frame independentThinh, L.P.; Sheridan, L. ; Scarani, V. 
7422-Jul-2013Tree-size complexity of multiqubit statesNguyên, L.H.; Cai, Y.; Wu, X.; Scarani, V. 
7519-Mar-2012Ultrafast quantum gates in circuit QEDRomero, G.; Ballester, D.; Wang, Y.M.; Scarani, V. ; Solano, E.
7625-Jan-2008Upper bounds for the security of two distributed-phase reference protocols of quantum cryptographyBranciard, C.; Gisin, N.; Scarani, V. 
77Feb-2012Validity of resonant two-qubit gates in the ultrastrong coupling regime of circuit quantum electrodynamicsWang, Y.M.; Ballester, D.; Romero, G.; Scarani, V. ; Solano, E.
782018Work production of quantum rotor enginesColombo, M; Lòpez-Perolio, I; Meeks, H.D; Caleca, L; Parsons, M.T; Li, H; De Vecchi, G; Tudini, E; Foglia, C; Mondini, P; Manoukian, S; Behar, R; Garcia, E.B.G; Meindl, A; Montagna, M; Niederacher, D; Schmidt, A.Y; Varesco, L; Wappenschmidt, B; Bolla, M.K; Dennis, J; Michailidou, K; Wang, Q; Aittomäki, K; Andrulis, I.L; Anton-Culver, H; Arndt, V; Beckmann, M.W; Beeghly-Fadel, A; Benitez, J; Boeckx, B; Bogdanova, N.V; Bojesen, S.E; Bonanni, B; Brauch, H; Brenner, H; Burwinkel, B; Chang-Claude, J; Conroy, D.M; Couch, F.J; Cox, A; Cross, S.S; Czene, K; Devilee, P; Dörk, T; Eriksson, M; Fasching, P.A; Figueroa, J; Fletcher, O; Flyger, H; Gabrielson, M; García-Closas, M; Giles, G.G; González-Neira, A; Guénel, P; Haiman, C.A; Hall, P; Hamann, U; Hartman, M ; Hauke, J; Hollestelle, A; Hopper, J.L; Jakubowska, A; Jung, A; Kosma, V.-M; Lambrechts, D; Le Marchand, L; Lindblom, A; Lubinski, J; Mannermaa, A; Margolin, S; Miao, H ; Milne, R.L; Neuhausen, S.L; Nevanlinna, H; Olson, J.E; Peterlongo, P; Peto, J; Pylkäs, K; Sawyer, E.J; Schmidt, M.K; Schmutzler, R.K; Schneeweiss, A; Schoemaker, M.J; See, M.H; Southey, M.C; Swerdlow, A; Teo, S.H; Toland, A.E; Tomlinson, I; Truong, T; van Asperen, C.J; van den Ouweland, A.M.W; van der Kolk, L.E; Winqvist, R; Yannoukakos, D; Zheng, W; Dunning, A.M; Easton, D.F; Henderson, A; Hogervorst, F.B.L; Izatt, L; Offitt, K; Side, L.E; van Rensburg, E.J; Embrace, S; Hebon, S; McGuffog, L; Antoniou, A.C; Chenevix-Trench, G; Spurdle, A.B; Goldgar, D.E; Hoya, M.D.L; Radice, P; kConFab/AOCS Investigators; Seah, S; Nimmrichter, S ; Scarani, V 
792020Worst-case quantum hypothesis testing with separable measurementsThinh, L.P.; Dall’Arno, M. ; Scarani, V.