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Anjam Khursheed

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Full Name
Anjam Khursheed
Variants
KHURSHEED ANJAM
Khursheed, Anjam
Khursheed, A.
KHURSHEED, ANJAM
 
Main Affiliation
 
Faculty
 
Email
esphead@nus.edu.sg
 
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Publications

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Results 1-15 of 15 (Search time: 0.014 seconds).

Issue DateTitleAuthor(s)
12018A high-brightness large-diameter graphene coated point cathode field emission electron sourceShao, X ; Srinivasan, A ; Ang, W.K ; Khursheed, A 
22018A Review Paper on "Graphene field emission for electron microscopy"Shao, X ; Khursheed, A 
31-Apr-2021Author Correction: Quantitative material analysis using secondary electron energy spectromicroscopy (Scientific Reports, (2020), 10, 1, (22144), 10.1038/s41598-020-78973-0)Han, W.; Zheng, M. ; Banerjee, A.; Luo, Y. Z. ; Shen, L. ; Khursheed, A. 
41-Nov-2021Characterization of materials using the secondary electron energy spectromicroscopy techniqueSrinivasan, Avinash ; Han, Weiding ; Zheng, Minrui ; Khursheed, Anjam 
510-May-2005Converting scanning electron microscopesKHURSHEED, ANJAM ; THONG, THIAM LEONG 
65-Feb-2008Electron microscope and a method of imaging objectsKHURSHEED, ANJAM 
713-Jul-2006Electron microscope and a method of imaging objectsKHURSHEED, ANJAM 
86-Sep-2011Electrostatic electron spectrometry apparatusKHURSHEED, ANJAM 
92019Fluorescence Invigoration in Carbon-Incorporated Zinc Oxide Nanowires from Passage of Field Emission ElectronsBah, A. ; Lim, K.Y. ; Wei, F.; Khursheed, A. ; Sow, C.H. 
1014-Jun-2005Lens for a scanning electron microscopeKHURSHEED, ANJAM 
1124-May-2011Multi-beam ion/electron spectra-microscopeKHURSHEED, ANJAM 
1231-Dec-2009Multi-beam ion/electron spectra-microscopeKHURSHEED ANJAM 
132020Quantitative material analysis using secondary electron energy spectromicroscopyHan, W.; Zheng, M. ; Banerjee, A.; Luo, Y.Z. ; Shen, L. ; Khursheed, Anjam 
1424-May-2005Reducing chromatic aberration in images formed by emmission electronsKHURSHEED, ANJAM 
1513-Nov-2007Scanning electron microscopeKHURSHEED, ANJAM