Please use this identifier to cite or link to this item:
https://doi.org/10.1116/1.2429671
Title: | Depth resolution studies in SiGe delta-doped multilayers using ultralow-energy Cs+ secondary ion mass spectrometry | Authors: | Chanbasha, A.R. Wee, A.T.S. |
Issue Date: | 2007 | Citation: | Chanbasha, A.R., Wee, A.T.S. (2007). Depth resolution studies in SiGe delta-doped multilayers using ultralow-energy Cs+ secondary ion mass spectrometry. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 25 (1) : 277-285. ScholarBank@NUS Repository. https://doi.org/10.1116/1.2429671 | Abstract: | It is known that depth resolution can be improved by lowering the primary ion impact energy (Ep) and/or increasing the impact angle (θ) up to a critical θ, beyond which surface roughening ensues. However, lower Ep is accompanied by lower secondary ion yield, and for ultralow-energy Cs+ primary beam, a poorly focused beam. In this study, the authors subject a Ge delta-doped Si sample to ultralow-energy ( | Source Title: | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures | URI: | http://scholarbank.nus.edu.sg/handle/10635/96173 | ISSN: | 10711023 | DOI: | 10.1116/1.2429671 |
Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.