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|Title:||Magnetic instability of giant magnetoresistance spin-valves due to electromigration-induced inter-diffusion|
|Keywords:||Cu spacer inter-diffusion|
GMR spin-valve multi-layers
|Citation:||Jiang, J., Bae, S., Ryu, H. (2009-07-31). Magnetic instability of giant magnetoresistance spin-valves due to electromigration-induced inter-diffusion. Thin Solid Films 517 (18) : 5557-5562. ScholarBank@NUS Repository. https://doi.org/10.1016/j.tsf.2009.04.028|
|Abstract:||Electromigration-induced magnetic failures in NiFe/(Co)/Cu/(Co)/NiFe spin-valve (SV) multilayers have been investigated. Electrically stressed NiFe/Cu/NiFe SV multilayers showed a dramatic reduction of magnetic moment up to 41%, and a shift of interlayer coupling characteristics, while no obvious magnetic degradation was observed in the NiFe/Co/Cu/Co/NiFe SV multilayers. It was experimentally confirmed that the magnetic degradation of the NiFe/Cu/NiFe SV multilayers is primarily due to the formation of Ni-Cu intermixing caused by the electromigration-induced Cu spacer inter-diffusion. Furthermore, it was demonstrated that an ultra thin Co diffusion barrier at the NiFe/Cu interface is promisingly effective to improve the magnetic stability of NiFe/(Co)/Cu/(Co)/NiFe SV multilayers against electromigration. © 2009 Elsevier B.V. All rights reserved.|
|Source Title:||Thin Solid Films|
|Appears in Collections:||Staff Publications|
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