Please use this identifier to cite or link to this item:
https://doi.org/10.1016/j.tsf.2009.04.028
DC Field | Value | |
---|---|---|
dc.title | Magnetic instability of giant magnetoresistance spin-valves due to electromigration-induced inter-diffusion | |
dc.contributor.author | Jiang, J. | |
dc.contributor.author | Bae, S. | |
dc.contributor.author | Ryu, H. | |
dc.date.accessioned | 2014-06-17T02:55:54Z | |
dc.date.available | 2014-06-17T02:55:54Z | |
dc.date.issued | 2009-07-31 | |
dc.identifier.citation | Jiang, J., Bae, S., Ryu, H. (2009-07-31). Magnetic instability of giant magnetoresistance spin-valves due to electromigration-induced inter-diffusion. Thin Solid Films 517 (18) : 5557-5562. ScholarBank@NUS Repository. https://doi.org/10.1016/j.tsf.2009.04.028 | |
dc.identifier.issn | 00406090 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/56553 | |
dc.description.abstract | Electromigration-induced magnetic failures in NiFe/(Co)/Cu/(Co)/NiFe spin-valve (SV) multilayers have been investigated. Electrically stressed NiFe/Cu/NiFe SV multilayers showed a dramatic reduction of magnetic moment up to 41%, and a shift of interlayer coupling characteristics, while no obvious magnetic degradation was observed in the NiFe/Co/Cu/Co/NiFe SV multilayers. It was experimentally confirmed that the magnetic degradation of the NiFe/Cu/NiFe SV multilayers is primarily due to the formation of Ni-Cu intermixing caused by the electromigration-induced Cu spacer inter-diffusion. Furthermore, it was demonstrated that an ultra thin Co diffusion barrier at the NiFe/Cu interface is promisingly effective to improve the magnetic stability of NiFe/(Co)/Cu/(Co)/NiFe SV multilayers against electromigration. © 2009 Elsevier B.V. All rights reserved. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.tsf.2009.04.028 | |
dc.source | Scopus | |
dc.subject | Cu spacer inter-diffusion | |
dc.subject | Electromigration-induced failures | |
dc.subject | GMR spin-valve multi-layers | |
dc.subject | Magnetic instability | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1016/j.tsf.2009.04.028 | |
dc.description.sourcetitle | Thin Solid Films | |
dc.description.volume | 517 | |
dc.description.issue | 18 | |
dc.description.page | 5557-5562 | |
dc.description.coden | THSFA | |
dc.identifier.isiut | 000267182700030 | |
Appears in Collections: | Staff Publications |
Show simple item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.