Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/142817
Title: STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY
Authors: WONG PEI YU CALVIN
ORCID iD:   orcid.org/0000-0002-3135-7534
Keywords: BEEM, I-V-T, TMDC, MoS2, WS2, Schottky barrier
Issue Date: 26-Jan-2018
Citation: WONG PEI YU CALVIN (2018-01-26). STUDYING THE METAL/LAYERED SEMICONDUCTOR SCHOTTKY INTERFACE USING TEMPERATURE DEPENDENT CURRENT-VOLTAGE MEASUREMENTS AND BALLISTIC ELECTRON EMISSION MICROSCOPY. ScholarBank@NUS Repository.
URI: http://scholarbank.nus.edu.sg/handle/10635/142817
Appears in Collections:Ph.D Theses (Closed)

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

6
checked on Aug 9, 2018

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.