Please use this identifier to cite or link to this item:
Title: Multi-technique analysis of MOCVD-grown lead lanthanum titanate (Pb1-xLax)TiO3 thin films on quartz substrates
Authors: Chen, H.Y.
Lin, J. 
Tan, K.L. 
Feng, Z.C. 
Kwak, B.S.
Erbil, A.
Issue Date: 1998
Citation: Chen, H.Y.,Lin, J.,Tan, K.L.,Feng, Z.C.,Kwak, B.S.,Erbil, A. (1998). Multi-technique analysis of MOCVD-grown lead lanthanum titanate (Pb1-xLax)TiO3 thin films on quartz substrates. Materials Research Society Symposium - Proceedings 493 : 493-498. ScholarBank@NUS Repository.
Abstract: A series of Lead lanthanum titanate (Pb1-xLax)TiO3 thin films with different compositions of x = 0 - 0.33 have been grown on fused quartz substrates by metallorganic chemical vapor deposition (MOCVD) and analyzed by a variety of techniques including X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), Raman scattering spectroscopy (RSS) and diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) techniques. XPS results confirmed the film composition of (Pb1-xLax)TiO3 and lanthanum enrichment in top surface layers. XRD indicates a preferred (100) orientation for the films with x values of 0.05-0.17, while the films with x values above 0.32 have randomly distributed orientations. A gradual change in the crystal structure from tetragonal to cubic arrangement with increasing La composition is noted. XPS data also show the variation of Ti-O, Pb-O and La-O bonding with the change in the La composition. The stretching vibrations corresponding to these oxygen related bonding are observed by DRIFT at 667, 826, 936 and 529 cm-1 respectively. This combined investigation on epitaxial PLT films may enhance our understanding of the ferroelectric PLT materials.
Source Title: Materials Research Society Symposium - Proceedings
ISSN: 02729172
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

checked on Jul 20, 2019

Google ScholarTM


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.