Monte Carlo simulation of size effect on the dielectric strength of α-quartz

Abstract

The size effect(SF) in a dielectric submitted to a surface space charge field was defined as the slope of the curve ln(Vs/r) vs ln(r), Vs and r are the critical surface potential and length of the sample respectively by Oh et al[1]. SF is an important material parameter affecting breakdown voltage, space charge detrapping field, friction coefficient, wear and fracture toughness of the dielectric. The findings of SF have many potential important application in electrical and mechanical engineering. In this report, we investigate this problem experimentally and theoretically, the experimental was carried out in the SEM using the electron beam to bombard the dielectric. The space charge distributions for different sizes are obtained separately from macroscopic equations and microscopic simulation.