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Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0168-583X(03)01098-X
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dc.titleIonoluminescence and ion beam induced secondary electron imaging of cubic boron nitride
dc.contributor.authorTeo, E.J.
dc.contributor.authorBettiol, A.A.
dc.contributor.authorUdalagama, C.N.B.
dc.contributor.authorWatt, F.
dc.date.accessioned2014-10-16T09:51:13Z
dc.date.available2014-10-16T09:51:13Z
dc.date.issued2003-09
dc.identifier.citationTeo, E.J., Bettiol, A.A., Udalagama, C.N.B., Watt, F. (2003-09). Ionoluminescence and ion beam induced secondary electron imaging of cubic boron nitride. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 210 : 501-506. ScholarBank@NUS Repository. https://doi.org/10.1016/S0168-583X(03)01098-X
dc.identifier.issn0168583X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98771
dc.description.abstractIn this work, we introduce the use of ionoluminescence (IL) with ion beam induced secondary electron (IBISE) imaging to correlate the surface topography and crystal faces with luminescence properties. Since both IL and IBISE require low beam currents of
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/S0168-583X(03)01098-X
dc.sourceScopus
dc.subjectBoron nitride
dc.subjectIonoluminescence
dc.subjectNuclear microprobe
dc.subjectSecondary electron imaging
dc.typeConference Paper
dc.contributor.departmentPHYSICS
dc.description.doi10.1016/S0168-583X(03)01098-X
dc.description.sourcetitleNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
dc.description.volume210
dc.description.page501-506
dc.description.codenNIMBE
dc.identifier.isiut000185352300093
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