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Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3586098
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dc.titleInvestigation of multi-resolution support for MeV ion microscopy imaging
dc.contributor.authorWhitlow, H.J.
dc.contributor.authorNorarat, R.
dc.contributor.authorSajavaara, T.
dc.contributor.authorLaitinen, M.
dc.contributor.authorRanttila, K.
dc.contributor.authorHeikkinen, P.
dc.contributor.authorHänninen, V.
dc.contributor.authorRossi, M.
dc.contributor.authorJones, P.
dc.contributor.authorTimonen, J.
dc.contributor.authorGilbert, L.K.
dc.contributor.authorMarjomäki, V.
dc.contributor.authorRen, M.
dc.contributor.authorVan Kan, J.A.
dc.contributor.authorOsipowicz, T.
dc.contributor.authorWatt, F.
dc.date.accessioned2014-10-16T09:51:11Z
dc.date.available2014-10-16T09:51:11Z
dc.date.issued2011
dc.identifier.citationWhitlow, H.J., Norarat, R., Sajavaara, T., Laitinen, M., Ranttila, K., Heikkinen, P., Hänninen, V., Rossi, M., Jones, P., Timonen, J., Gilbert, L.K., Marjomäki, V., Ren, M., Van Kan, J.A., Osipowicz, T., Watt, F. (2011). Investigation of multi-resolution support for MeV ion microscopy imaging. AIP Conference Proceedings 1336 : 253-256. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3586098
dc.identifier.isbn9780735408913
dc.identifier.issn0094243X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98768
dc.description.abstractTo minimize the dose applied to the specimens during imaging in a MeV ion microbeam we have investigated new concepts that allow collection of images with multi-resolution support. To test the concept, a set of reference PIXE microbeam images with well-characterised noise were segmented using both a direct down-sampling technique and wavelet decomposition. The results show both techniques could be used to select fields of view with
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3586098
dc.sourceScopus
dc.subjectBiomedical
dc.subjectImage-decomposition
dc.subjectIon microprobe
dc.subjectNuclear microbeam
dc.subjectPIXE
dc.subjectWavelet
dc.typeConference Paper
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.3586098
dc.description.sourcetitleAIP Conference Proceedings
dc.description.volume1336
dc.description.page253-256
dc.identifier.isiut000302912900052
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