Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3691958
DC FieldValue
dc.titleWhy edge effects are important on the intrinsic loss mechanisms of graphene nanoresonators
dc.contributor.authorJiang, J.-W.
dc.contributor.authorWang, J.-S.
dc.date.accessioned2014-10-16T09:48:50Z
dc.date.available2014-10-16T09:48:50Z
dc.date.issued2012-03-01
dc.identifier.citationJiang, J.-W., Wang, J.-S. (2012-03-01). Why edge effects are important on the intrinsic loss mechanisms of graphene nanoresonators. Journal of Applied Physics 111 (5) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3691958
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98586
dc.description.abstractMolecular dynamics simulations are performed to investigate edge effects on the quality factor of graphene nanoresonators with different edge configurations and of various sizes. If the periodic boundary condition is applied, very high quality factors (3 × 10 5) are obtained for all kinds of graphene nanoresonators. However, if the free boundary condition is applied, quality factors will be greatly reduced by two effects resulting from free edges: the imaginary edge vibration effect and the artificial effect. Imaginary edge vibrations will flip between a pair of doubly degenerate warping states during the mechanical oscillation of nanoresonators. The flipping process breaks the coherence of the mechanical oscillation of the nanoresonator, which is the dominant mechanism for extremely low quality factors. There is an artificial effect if the mechanical oscillation of the graphene nanoresonator is actuated according to an artificial vibration (non-natural vibration of the system), which slightly reduces the quality factor. The artificial effect can be eliminated by actuating the mechanical oscillation according to a natural vibration of the nanoresonator. Our simulations provide an explanation for the recent experiment, where the measured quality factor is low and varies between identical samples with free edges. © 2012 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3691958
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.3691958
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume111
dc.description.issue5
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000301729200124
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.