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Please use this identifier to cite or link to this item: https://doi.org/10.1154/1.3624887
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dc.titleStructure of melt-quenched AgIn3Te5
dc.contributor.authorRangasami, C.
dc.contributor.authorMalar, P.
dc.contributor.authorOsipowicz, T.
dc.contributor.authorJain, M.K.
dc.contributor.authorKasiviswanathan, S.
dc.date.accessioned2014-10-16T09:42:37Z
dc.date.available2014-10-16T09:42:37Z
dc.date.issued2011-10-13
dc.identifier.citationRangasami, C., Malar, P., Osipowicz, T., Jain, M.K., Kasiviswanathan, S. (2011-10-13). Structure of melt-quenched AgIn3Te5. Powder Diffraction 26 (3) : 248-255. ScholarBank@NUS Repository. https://doi.org/10.1154/1.3624887
dc.identifier.issn08857156
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98069
dc.description.abstractPolycrystalline AgIn3Te5 synthesized by melt-quench technique has been analyzed using proton induced X-ray emission (PIXE), X-ray diffraction (XRD), and selected area electron diffraction. PIXE analysis yielded the content of Ag, In, and Te, respectively, to be 9.76%, 31.18%, and 59.05% by weight. Structure refinement was carried out considering those space groups from I- and P-type tetragonal systems which possess 4̄ symmetry and preserve the anion sublattice arrangement of the chalcopyrite structure (space group: I4̄2d) as well. The results showed that AgIn3Te5 synthesized by melt-quench method crystallizes with P-type tetragonal structure (space group: P4̄2c; unit-cell parameters a = 6.2443(8) and c = 12.5058(4) Å), the presence of which was corroborated by selected area electron diffraction studies. © 2011 International Centre for Diffraction Data.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1154/1.3624887
dc.sourceScopus
dc.subjectAgIn3Te5
dc.subjectElectron diffraction
dc.subjectP-type tetragonal
dc.subjectPIXE
dc.subjectRietveld refinement
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1154/1.3624887
dc.description.sourcetitlePowder Diffraction
dc.description.volume26
dc.description.issue3
dc.description.page248-255
dc.identifier.isiut000296000200005
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