Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/98049
DC FieldValue
dc.titleStructural and electronic properties of h-BN
dc.contributor.authorLiu, L.
dc.contributor.authorFeng, Y.P.
dc.contributor.authorShen, Z.X.
dc.date.accessioned2014-10-16T09:42:24Z
dc.date.available2014-10-16T09:42:24Z
dc.date.issued2003-09
dc.identifier.citationLiu, L.,Feng, Y.P.,Shen, Z.X. (2003-09). Structural and electronic properties of h-BN. Physical Review B - Condensed Matter and Materials Physics 68 (10) : 1041021-1041028. ScholarBank@NUS Repository.
dc.identifier.issn01631829
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98049
dc.description.abstractEffects of stacking behavior of hexagonal basal layers to the structural stability and electronic properties of h-BN were investigated thoroughly using first-principles calculations based on the density-functional theory local-density approximation. Three of five possible h-BN structures with "good" stacking were found to be stable or substable. Considering that intrinsic stacking fault exist in real h-BN crystals which results in mixed stacking behavior, the experimentally observed large interlayer spacing of structures with stacking disorder such as PBN and t-BN can be understood. A substable structure with a direct band gap of about 3.395 eV was predicted. The existence of this substable structure and related intrinsic stacking fault in real h-BN explains the discrepancy in the nature of the band gap and the large variation in the observed band-gap values of h-BN.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.sourcetitlePhysical Review B - Condensed Matter and Materials Physics
dc.description.volume68
dc.description.issue10
dc.description.page1041021-1041028
dc.description.codenPRBMD
dc.identifier.isiutNOT_IN_WOS
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