Please use this identifier to cite or link to this item: https://doi.org/10.1088/0960-1317/16/10/008
DC FieldValue
dc.titleStamps for nanoimprint lithography fabricated by proton beam writing and nickel electroplating
dc.contributor.authorAnsari, K.
dc.contributor.authorVan Kan, J.A.
dc.contributor.authorBettiol, A.A.
dc.contributor.authorWatt, F.
dc.date.accessioned2014-10-16T09:41:59Z
dc.date.available2014-10-16T09:41:59Z
dc.date.issued2006-10-01
dc.identifier.citationAnsari, K., Van Kan, J.A., Bettiol, A.A., Watt, F. (2006-10-01). Stamps for nanoimprint lithography fabricated by proton beam writing and nickel electroplating. Journal of Micromechanics and Microengineering 16 (10) : 1967-1974. ScholarBank@NUS Repository. https://doi.org/10.1088/0960-1317/16/10/008
dc.identifier.issn09601317
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98014
dc.description.abstractIn the emerging fields of nanoscience and nanotechnology, the demands for low-cost and high-throughput nanolithographic techniques have increased. Nanoimprint lithography is considered as one of the candidates showing high potential for nanofabrication, and here we report a fabrication process that utilizes high-quality nickel stamps with micron features down to sub-100 nm, made using proton beam writing coupled with nickel sulfamate electroplating. The fabricated stamps have a high aspect ratio, with smooth and vertical sidewalls. Nanoindentation and atomic force microscopy (AFM) measurements of the features on the surface of the stamps indicate a hardness of 5 GPa and a sidewall roughness of 7 nm. The stamps have been used for nanoimprint lithography on polymethylmethacrylate (PMMA) substrates and the imprinted patterns show a high degree of reproducibility. © 2006 IOP Publishing Ltd.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1088/0960-1317/16/10/008
dc.description.sourcetitleJournal of Micromechanics and Microengineering
dc.description.volume16
dc.description.issue10
dc.description.page1967-1974
dc.description.codenJMMIE
dc.identifier.isiut000242169400009
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.