Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0218-625X(01)00143-9
DC FieldValue
dc.titleSimulations of x-ray photoelectron diffraction experiment from theoretical calculations
dc.contributor.authorZheng, J.-C.
dc.contributor.authorWang, H.-Q.
dc.contributor.authorHuan, C.H.A.
dc.contributor.authorWee, A.T.S.
dc.date.accessioned2014-10-16T09:41:03Z
dc.date.available2014-10-16T09:41:03Z
dc.date.issued2001
dc.identifier.citationZheng, J.-C.,Wang, H.-Q.,Huan, C.H.A.,Wee, A.T.S. (2001). Simulations of x-ray photoelectron diffraction experiment from theoretical calculations. Surface Review and Letters 8 (5) : 549-557. ScholarBank@NUS Repository. <a href="https://doi.org/10.1016/S0218-625X(01)00143-9" target="_blank">https://doi.org/10.1016/S0218-625X(01)00143-9</a>
dc.identifier.issn0218625X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/97934
dc.description.abstractIn this paper, we demonstrate the simulation of XPD experiments through theoretical calculations. We present examples, e.g. oxygen-induced Cu(210) surface and oxygenated diamond surface, to illustrate how to obtain the optimized XPD experimental parameters by MSCD simulations for distinguishing two different models. Our results suggest that for the adsorbate-induced reconstructions on metal or semiconductor surfaces, XPD from adsorbate is more sensitive to the detailed surface structure than XPD from bulk elements. Whether to choose energy-scanned or angle-scanned mode will depend on the systems under investigation. One should check any limitations in the instruments used, and then perform the theoretical simulations for typical available parameters in order to select the best mode, emitters, and optimized parameters.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/S0218-625X(01)00143-9
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1016/S0218-625X(01)00143-9
dc.description.sourcetitleSurface Review and Letters
dc.description.volume8
dc.description.issue5
dc.description.page549-557
dc.description.codenSRLEF
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.