Please use this identifier to cite or link to this item: https://doi.org/10.1088/0022-3727/33/21/304
DC FieldValue
dc.titleSandwich-structured thin film of silicon nanoparticles embedded in Al2O3 matrices
dc.contributor.authorZhu, Y.
dc.contributor.authorWang, H.
dc.contributor.authorOng, P.P.
dc.date.accessioned2014-10-16T09:40:06Z
dc.date.available2014-10-16T09:40:06Z
dc.date.issued2000-11-07
dc.identifier.citationZhu, Y., Wang, H., Ong, P.P. (2000-11-07). Sandwich-structured thin film of silicon nanoparticles embedded in Al2O3 matrices. Journal of Physics D: Applied Physics 33 (21) : 2687-2690. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/33/21/304
dc.identifier.issn00223727
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/97853
dc.description.abstractSilicon nanoparticles embedded in the host matrix of an Al2O3 thin film, with a thickness of about 260 nm, were prepared by using the pulsed laser deposition method. The laser target consisted of a small silicon wafer glued onto the surface of a circular Al2O3 plate, which was set to rotate uniformly when laser-ablating. TEM and EDS results showed that the films consisted of silicon nanoparticles in the form of nanocrystals with diameters of less than 6 nm dispersed in the amorphous Al2O3 matrices. A secondary ion mass spectroscopy depth profile of the silicon content of the film indicated that the silicon nanoparticles in the Al2O3 matrices were arranged in fairly well demarcated thin layers sandwiched between layers of the host material. FTIR results evidently suggested that the encapsulating amorphous Al2O3 material forms a good host for the prevention of atmospheric oxidation of the silicon nanoparticles. However, prolonged annealing can cause the silicon nanoparticle surface interfacing the host material to be oxidized by the oxygen mostly from the Al2O3 molecules and to be bonded to the Al or O-Al bonds.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1088/0022-3727/33/21/304
dc.description.sourcetitleJournal of Physics D: Applied Physics
dc.description.volume33
dc.description.issue21
dc.description.page2687-2690
dc.description.codenJPAPB
dc.identifier.isiut000165386800007
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