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Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.111611
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dc.titleRaman scattering and x-ray diffraction investigations of highly textured (Pb1-xLax)TiO3 thin films
dc.contributor.authorFeng, Z.C.
dc.contributor.authorKwak, B.S.
dc.contributor.authorErbil, A.
dc.contributor.authorBoatner, L.A.
dc.date.accessioned2014-10-16T09:38:42Z
dc.date.available2014-10-16T09:38:42Z
dc.date.issued1994
dc.identifier.citationFeng, Z.C., Kwak, B.S., Erbil, A., Boatner, L.A. (1994). Raman scattering and x-ray diffraction investigations of highly textured (Pb1-xLax)TiO3 thin films. Applied Physics Letters 64 (18) : 2350-2352. ScholarBank@NUS Repository. https://doi.org/10.1063/1.111611
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/97734
dc.description.abstractHighly textured lead lanthanum titanate (PLT) thin films grown on Si(100) substrates by the metalorganic chemical vapor deposition technique are characterized using x-ray diffraction (XRD), Raman spectroscopy, and energy-dispersive x-ray analysis. The texturing consisted of an alignment of the {100} crystallographic axes of the film perpendicular to the Si substrate. The tetragonality of the films was found to decrease as the lanthanum concentration increased. Raman spectra exhibited features characteristic of bulk PLT, including the observation of the soft mode. Variations of the phonon modes for PLT have been investigated as a function of La concentration and sample temperature.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.111611
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.111611
dc.description.sourcetitleApplied Physics Letters
dc.description.volume64
dc.description.issue18
dc.description.page2350-2352
dc.identifier.isiutA1994NK02600008
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