Parameter modifications in the phase diagrams of the transverse field Ising model

Abstract

By taking into account three different exchange interaction parameters (the surface, the inter-layer, and the intra-layer couplings) and two different transverse field parameters (on the surface and inside the film), the phase diagrams of the n-layer ferroelectric thin film described by the transverse field Ising model have been studied in the framework of the mean field approach. The results show that the features of the phase diagrams can be greatly modified by changing the exchange interactions or transverse field parameters. The crossover features of the parameters from the ferroelectric dominant phase diagram to the paraelectric dominant phase diagram are determined for the first time. © 2004 Elsevier B.V. All rights reserved.