Please use this identifier to cite or link to this item: https://doi.org/10.1109/94.590873
DC FieldValue
dc.titleInsulator size effect on electron-irradiated quartz
dc.contributor.authorSong, Z.G.
dc.contributor.authorOng, C.K.
dc.contributor.authorGong, H.
dc.date.accessioned2014-10-16T09:29:27Z
dc.date.available2014-10-16T09:29:27Z
dc.date.issued1997
dc.identifier.citationSong, Z.G., Ong, C.K., Gong, H. (1997). Insulator size effect on electron-irradiated quartz. IEEE Transactions on Dielectrics and Electrical Insulation 4 (1) : 88-91. ScholarBank@NUS Repository. https://doi.org/10.1109/94.590873
dc.identifier.issn10709878
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96943
dc.description.abstractA time-resolved current experiment measuring separately the surface and bulk currents flowing through an insulating sample under electron beam irradiation employing a scanning electron microscope is performed to investigate charging and flashover phenomena. A set of metallic apertures of various values of radius are used to vary the area of the insulator. It is observed that the bulk current decreases monotonically with time until reaching a constant value, while the surface current exhibits two different trends: decreasing monotonically with time, and decreasing with time at first and then increasing. Such observations are related to the establishment of a dynamic equilibrium between electron trapping and detrapping, as well as the flashover behavior, and depends on the insulator size and the experimental conditions. © 1997 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/94.590873
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE
dc.contributor.departmentPHYSICS
dc.description.doi10.1109/94.590873
dc.description.sourcetitleIEEE Transactions on Dielectrics and Electrical Insulation
dc.description.volume4
dc.description.issue1
dc.description.page88-91
dc.description.codenITDIE
dc.identifier.isiutA1997WV23400012
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