Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3356984
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dc.titleDemagnetization process and hysteresis loops in perpendicularly oriented hard/soft trilayers
dc.contributor.authorZhao, G.P.
dc.contributor.authorBo, N.
dc.contributor.authorZhang, H.W.
dc.contributor.authorFeng, Y.P.
dc.contributor.authorDeng, Y.
dc.date.accessioned2014-10-16T09:20:10Z
dc.date.available2014-10-16T09:20:10Z
dc.date.issued2010-04-15
dc.identifier.citationZhao, G.P., Bo, N., Zhang, H.W., Feng, Y.P., Deng, Y. (2010-04-15). Demagnetization process and hysteresis loops in perpendicularly oriented hard/soft trilayers. Journal of Applied Physics 107 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3356984
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96160
dc.description.abstractNucleation and evolution of domain walls as well as the magnetic reversal process in perpendicularly oriented hard/soft trilayers have been investigated within a micromagnetic approach, concentrated on the situation with very thin hard layer. The formula for the nucleation field has been derived, which falls as the soft layer thickness rises. Negative nucleation field occurs at thick soft layer when the shape anisotropy surpasses the crystalline one, where the magnetization in the center of the soft layer obeys the coherent rotation model. The microscopic and macroscopic hysteresis loops have been calculated numerically, with the angular distribution of the magnetization between the nucleation and pinning fields obtained. The area of the hysteresis loop decreases while the coercivity mechanism changes from nucleation to pinning as the soft layer thickness increases. The effect of the hard layer thickness is contrary to that of the soft layer, however, the former affects the demagnetization process and hysteresis loops significantly only when the layers are thin enough. © 2010 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3356984
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.3356984
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume107
dc.description.issue8
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000277303200062
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