Please use this identifier to cite or link to this item: https://doi.org/10.1021/jp307864d
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dc.titleDefect engineering in CdSxSe1-x nanobelts: An insight into carrier relaxation dynamics via optical pump-terahertz probe spectroscopy
dc.contributor.authorLiu, H.
dc.contributor.authorLu, J.
dc.contributor.authorTeoh, H.F.
dc.contributor.authorLi, D.
dc.contributor.authorFeng, Y.P.
dc.contributor.authorTang, S.H.
dc.contributor.authorSow, C.H.
dc.contributor.authorZhang, X.
dc.date.accessioned2014-10-16T09:20:06Z
dc.date.available2014-10-16T09:20:06Z
dc.date.issued2012-12-13
dc.identifier.citationLiu, H., Lu, J., Teoh, H.F., Li, D., Feng, Y.P., Tang, S.H., Sow, C.H., Zhang, X. (2012-12-13). Defect engineering in CdSxSe1-x nanobelts: An insight into carrier relaxation dynamics via optical pump-terahertz probe spectroscopy. Journal of Physical Chemistry C 116 (49) : 26036-26042. ScholarBank@NUS Repository. https://doi.org/10.1021/jp307864d
dc.identifier.issn19327447
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/96154
dc.description.abstractDefects in nanomaterials often induce dramatic changes in the photoelectrical properties of semiconducting II-VI compound nanomaterials. The relationship between defects and carrier dynamics is pivotal in material engineering for potential applications. A thorough understanding of the dynamics of defect-related free carrier depletion is particularly important for the fabrication and optimization of nano-optoelectronic devices. In this work, optical pump-terahertz probe spectroscopy was employed to investigate the carrier dynamics in CdS and Se-alloyed CdS nanobelts. The dynamics are dominated by the surface defect trapping in the case of CdS and structural-defect-related recombination for the Se-alloyed CdS. The conclusion is also supported by temperature-dependent photoluminescence spectroscopic studies. Our results indicate that congeneric element replacement is an effective approach for defect-distribution restructuring, which modifies the physical properties of nanomaterials through defect engineering. © 2012 American Chemical Society.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1021/jp307864d
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1021/jp307864d
dc.description.sourcetitleJournal of Physical Chemistry C
dc.description.volume116
dc.description.issue49
dc.description.page26036-26042
dc.identifier.isiut000312176100049
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