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Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.355873
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dc.titleA novel scanning electron microscope method for the investigation of charge trapping in insulators
dc.contributor.authorGong, H.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-10-16T09:14:21Z
dc.date.available2014-10-16T09:14:21Z
dc.date.issued1994
dc.identifier.citationGong, H., Ong, C.K. (1994). A novel scanning electron microscope method for the investigation of charge trapping in insulators. Journal of Applied Physics 75 (1) : 449-453. ScholarBank@NUS Repository. https://doi.org/10.1063/1.355873
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/95663
dc.description.abstractA new technique using a copper detector in a scanning electron microscope is introduced for the investigation of charging in insulators, and pure single-crystalline α-quartz samples are studied. The curve of charging rate varying with time is obtained, and the total charge trapped in the sample is accurately determined. Furthermore, the effects of electron-beam energy and current on charging are also examined. Our results suggest that electron-radiation-induced defects in the sample play major roles in the charge trapping. Details of the experimental setup are given.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.355873
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.355873
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume75
dc.description.issue1
dc.description.page449-453
dc.identifier.isiutA1994MQ40200065
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