Please use this identifier to cite or link to this item: https://doi.org/10.1021/nl9028736
DC FieldValue
dc.titleHigh mobility, printable, and solution-processed graphene electronics
dc.contributor.authorWang, S.
dc.contributor.authorAng, P.K.
dc.contributor.authorWang, Z.
dc.contributor.authorTang, A.L.L.
dc.contributor.authorThong, J.T.L.
dc.contributor.authorLoh, K.P.
dc.date.accessioned2014-10-16T08:30:05Z
dc.date.available2014-10-16T08:30:05Z
dc.date.issued2010-01-13
dc.identifier.citationWang, S., Ang, P.K., Wang, Z., Tang, A.L.L., Thong, J.T.L., Loh, K.P. (2010-01-13). High mobility, printable, and solution-processed graphene electronics. Nano Letters 10 (1) : 92-98. ScholarBank@NUS Repository. https://doi.org/10.1021/nl9028736
dc.identifier.issn15306984
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/93928
dc.description.abstractThe ability to print graphene sheets onto large scale, flexible substrates holds promise for large scale, transparent electronics on flexible substrates. Solution processable graphene sheets derived from graphite can form stable dispersions in solutions and are amenable to bulk scale processing and ink jet printing. However, the electrical conductivity and carrier mobilities of this material are usually reported to be orders of magnitude poorer than that of the mechanically cleaved counterpart due to its higher density of defects, which restricts its use in electronics. Here, we show that by optimizing several key factors in processing, we are able to fabricate high mobility graphene films derived from large sized graphene oxide sheets, which paves the way for all-carbon post-CMOS electronics. All-carbon source-drain channel electronics fabricated from such films exhibit significantly improved transport characteristics, with carrier mobilities of 365 cm2/(V · s) for hole and 281 cm2/(V · s) for electron, measured in air at room temperature. In particular, intrinsic mobility as high as 5000 cm 2/(V · s) can be obtained from such solution-processed graphene films when ionic screening is applied to nullify the Coulombic scattering by charged impurities. © 2010 American Chemical Society.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1021/nl9028736
dc.sourceScopus
dc.subjectDoping
dc.subjectGraphene
dc.subjectHigh mobility transistor
dc.subjectImpurity scattering
dc.subjectIonic screening
dc.subjectPrintable electronics
dc.subjectSolution-processed
dc.typeArticle
dc.contributor.departmentCHEMISTRY
dc.description.doi10.1021/nl9028736
dc.description.sourcetitleNano Letters
dc.description.volume10
dc.description.issue1
dc.description.page92-98
dc.identifier.isiut000273428700016
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.