Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3564946
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dc.titleEffects of CrRu-SiOx underlayer with MgO intermediate layer on the microstructure and magnetic properties of FePt-C thin film
dc.contributor.authorLi, H.H.
dc.contributor.authorHu, J.F.
dc.contributor.authorJu, G.
dc.contributor.authorChow, G.M.
dc.contributor.authorChen, J.S.
dc.date.accessioned2014-10-07T09:55:50Z
dc.date.available2014-10-07T09:55:50Z
dc.date.issued2011-04-01
dc.identifier.citationLi, H.H., Hu, J.F., Ju, G., Chow, G.M., Chen, J.S. (2011-04-01). Effects of CrRu-SiOx underlayer with MgO intermediate layer on the microstructure and magnetic properties of FePt-C thin film. Journal of Applied Physics 109 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3564946
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/86875
dc.description.abstractThe effect of the CrRu-SiOx underlayer with different doping concentrations and the thickness of the CrRu underlayer on the microstructure and magnetic properties of FePt-C films were investigated. FePt films exhibited L10 (001) texture at various SiOx doping concentrations. The coercivities were as large as 28 kOe and the slope of M-H loop at coercivity was approximately equal to 1, suggesting that FePt grains were well exchange decoupled. Grain size was only slightly reduced after introducing the CrRu-SiOx underlayer. But the contact angle between the FePt grains and the MgO intermediate layer around 135 indicated the a MgO intermediate layer was not favored for smaller grains to obtain good L10 (001) texture. X-ray photoelectron spectroscopy in-depth profile showed that Si diffused into a whole FePt-C layer and C diffused to the film surface. © 2011 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3564946
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1063/1.3564946
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume109
dc.description.issue7
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000289949000254
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